Advanced Materials Analysis and Imaging Services
Explore a range of advanced materials analysis and imaging services offered, including dual-beam FIB techniques for sample preparation, STEM imaging, EDS characterization, and nano-patterning. Services cover a variety of samples such as interstitial steel, TiO2/SiO2, Ni on pyramidal Si, and more. Benefit from state-of-the-art equipment like HR-TEM 300 kV Tecnai G2 F30 for precise analysis and imaging. Get insights into sample structures, grain boundaries, and interface properties. Dive into image analysis on the dual-beam FIB system, revealing intricate details of materials like Tin balls on Carbon, Au on Ag Nano Forest, and more.
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Presentation Transcript
Sample : Interstitial steel Required information : To study grains and grain boundaries in the sample Lamella Preparation, Thinning and STEM imaging using FIB at SAIF
Lamella analysis using TEM Imaging and EDS Characterization (HR-TEM 300 kV, Tecnai G2, F30 at SAIF)
Sample : TiO2/SiO2 Required information : To study alternate multilayers of TiO2 and SiO2 Lamella Preparation, Thinning and STEM imaging and EDS analysis using FIB at SAIF
Sample 3 : Ni on Pyramidal Si Required information : To check if oxide is present at the Ni - Si interface Lamella Preparation, Thinning and STEM imaging and EDS analysis using FIB at SAIF
NANO PATTERNING for Optical lenses on gold and Titanium Micro rings and holes on Titanium Nano Patterning on Au using FIB
IMAGE ANALYSIS on the Dual beam-FIB at SAIF Tin balls on Carbon Mesoporous Silica Au on Carbon Au on Ag Nano Forest
