
Advanced Photon Detector (APD) Research Findings and Applications
Explore groundbreaking research on Mesh APD technology, 4D tracking noise issues, amplifier evaluations, and signal-to-noise ratio testing in photon detection. Learn about APD signal testing methodologies and the impact of scale on noise measurements. Discover the latest insights on S/N ratios, gain optimization, and baseline noise considerations for Mesh APDs.
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S/N Issue of Mesh APD Changguo Lu, KT McDonald Princeton University 3/2/2016; updated 3/4/2016 1
N. Cartiglia, INFN, Torino, 2/15-19/2016 - 4D tracking Noise in LGAD & APD Aide Memoire According to this argument it raises a series question about the application of APD to the fast timing: LGAD 10~20 gain is better than high gain APD (>100). 2
If the detector can provide good S/N even when its signal is small, we still can use a good amplifier (high gain and low noise figure) to get a large enough signal. We have tested following five commercial amplifiers; obviously, the Wenteq is the best. [The custom amplifier developed at U Penn is even better.] Ampommerlifier Bandwidth( MHz) Gain Noise figure Wenteq ABL0100-01-5010 10 - 1000 50 dB 1.0 dB ZFL-2500+ 500 - 2500 28 dB 6 ~ 8.6 dB ZKL-1R5+ 10 - 1500 40 3.0 dB ZX60-33LN-S+ 50 - 3000 100 1000 2000 3000 1.1 dB 21.9 18.8 14.5 11.9 ZVA-213 800 - 21000 26 2.5 ~ 4.7 dB 3
Test S/N for Mesh APD with Agilent MSO9404A Scope The test circuit used with an RMD 8 8 mm2 APD, with mesh electrode, is the following: Three outputs are connected to scope via SMA cables. The VCSEL 980-nm laser diode is triggered by an HP 8131A pulser with fixed pulse shape; the laser light is transferred via optical fiber to a focusing lens, which is placed in front of APD. The entire APD test box and focusing lens is located inside an environmental chamber, which used primarily as a dark box/Faraday cage. 4
RMS noise of APD signal We noticed that the measured rms noise with digital scope depends on the scope scale used in the measurement (so-called digitization error). We have to understand this behavior first. We leave the scope connected to APD electrode while we change the scope s scale, and observe measured rms noise as follows: 35 y = 0.0301x + 0.0903 30 baseline rms noise(mV) 25 20 15 10 5 0 0 200 400 600 800 1000 1200 Scale(mV/div) The rms noise is linear with the vertical scale of the scope. Of course, if we measure S/N using the scope with the same vertical scale for both signal and rms noise, there is no additional normalization required, and we can directly use the measured signal and rms-noise values in the calculation. 5
S/N of Mesh APD In the plot of S/N and Gain vs. HV below, the S/N ratio is still improving at the maximum HV we have tested, -1800V, which is close to the APD breakdown voltage. The baseline noise is that observed in the full 4-GHz bandwidth of the scope, although fast-timing measurements are made with amplifiers of 500-MHz bandwidth; the results below overestimate the noise relevant to a timing measurement. 100 1000 S/N Gain 1000 100 sig vs gain noise vs gain 100 Gain S/N 10 10 Signal, Noise 10 1 1 1 0.1 0.1 0 500 1000 1500 2000 HV(V) 0.01 0.1 1 10 100 1000 Gain An optimum S/N value of 10-20 is not the case for an RMD APD. The baseline noise rises more slowly than linearly with gain, favoring operation at the highest possible gain. 6
S/N of 22 mm2 APD A signal/noise study of a 2 2 mm2 RMD APD was reported in Fig. 2 of Farrell et al, NIM A353, 176 (1994), using an Fe-55 source. http://physics.princeton.edu/~mcdonald/examples/detectors/farrell_nim_a353_176_94.pdf From Fig 2. of NIM A353, 176 (1994) 100000 Signal 10000 Noise Signal, Noise, S/N S/N 1000 100 10 1 10 100 1000 10000 100000 Gain For gains < 500, the results are similar to those on slide 6 (tho better S/N at a given gain observed on slide 6), while for higher gains the noise rises more quickly with gain (excess noise factor F changes), the S/N drops. The optimum gain is in the range 500-1000, but it is difficult to operate a large RMD APD stabily at such high gain. 7
Should We Consider Noise during the Signal? The goal of the present consideration of noise is to estimate the rms time resolution for pulses in a silicon device according to where N is a relevant rms noise, and S is the pulse signal. , t rise S N = Discussion of noise in silicon devices with gain include a contribution due to fluctuations in the gain process, typically characterized by the excess noise factor F. Should the noise in the above expression for t include the noise during the pulse associated with the excess noise factor? A comparison of the baseline noise (with no signal) to the noise during a pulse of 4500 optical photons incident on a 2 2 mm2 RMD APD is presented in Fig. 8 of Redus and Farrell, PSPIE 2859, 288 (1996), http://physics.princeton.edu/~mcdonald/examples/detectors/redus_spie_2859_288_96.pdf 10000 Fig 8. Redus & Farrell, PSPIE 2859, 288 (1996) Signal, Noise, S/N 1000 Signal 100 Noise (no signal) Noise (in signal) 10 S/N_no_signal S/N_in_signal 1 1 10 100 Gain 1000 10000 The noise during the signal is the rms width of the observed pulse-area distribution. When the noise during the signal is included, the maximum S/N is about 20:1, at gain of 100, for 4500 incident optical photons, whose energy deposition is roughly equivalent to that of 1 minimum-ionizing particle (1 MIP). For the observed rise time rise ~ 1.3 ns in an 8 8 mm2 RMD APD, we observe t ~ 11 ps for a 1-MIP-equivalent pulse of 980-nm photons, http://physics.princeton.edu/~mcdonald/LHC/Lu/Time_resolution_with_beam_splitterE.pptx However, if we use S/N = 20, the prediction would be 65 ps. = riseN S = / t 8 We infer that it is better to use the no-signal noise when estimating time resolution.