Chip Map and Commissioning Updates in Run-14 for VTX Status
Explore the latest updates on commissioning for VTX Status in Run-14, including chip maps of WEST and EAST, ladder inspections, and optimization efforts. Discover the progress made in optimizing operation parameters and addressing chip issues during the commissioning process.
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VTX Status Maki KUROSAWA VTX Group 2014 Feb 20 1
Run 14 We will have a 22 week run. 15 GeV/n AuAu is running (3 weeks). First collision on 13th Feb 200 GeV/n AuAu will start second week of Mar (~Jul 7th). 2
VTX Status Commissioning started on Feb 3rd. Found one ladder (B1-L11) didn t work. Current consumption is low. It was working before the installation of VTX FEM is working. Optical cable connection is good. No broken cables. We inspected visually the connection of connectors except for bus connector at detector side. There were no loose connectors. Out put voltage of LV cable was nominal voltage. Possible cause Bus connector were loose. Regulator on SPIRO board. For more inspection, it is required to disassemble barrel. Nothing to do for this ladder for now. 3
Chip Map of WEST (Commissioning in Run-14 20140205) Pulse Test (sent pulse to col10 and 20) Good Chip 50% Dead Chip 100% Dead Chip 50 CNT acceptance LADDER SPIRO WEST South North 4 SPIRO 15 14 13 12 11 10 9 8 7 6 5 3 2 1 0 8 10 5 36 17 49 51 71 48 47 B0-L4 B0-L3 B0-L2 B0-L1 B0-L0 58 59 27 28 29 Barrel 0 34 15 35 32 24 13 11 16 6 20 37 31 38 46 39 53 40 55 41 60 B1-L9 B1-L8 B1-L7 B1-L6 B1-L5 B1-L4 B1-L3 B1-L2 B1-L1 B1-L0 30 16 78 17 61 18 56 20 57 67 Barrel 1 Col 0 is always hot for two chips. should be masked. 4 No Change from Run13 and a test at Chemistry Lab
Chip Map of EAST (Commissioning in Run-14 20140205) Pulse Test (sent pulse to col10 and 20) Good Chip 50% Dead Chip 100% Dead Chip 50 CNT acceptance LADDER SPIRO EAST North South 4 SPIRO 15 14 13 12 11 10 9 8 7 6 5 3 2 1 0 25 39 9 23 19 12 13 14 69 68 B0-L5 B0-L6 B0-L7 B0-L8 B0-L9 72 73 74 76 77 Barrel 0 18 30 33 31 22 27 12 26 14 21 32 54 33 52 70 50 35 43 36 42 B1-L10 B1-L11 B1-L12 B1-L13 B1-L14 B1-L15 B1-:16 B1-L17 B1-L18 B1-L19 21 62 22 63 24 64 25 65 26 66 Barrel 1 No Change from a test at Chemistry Lab except for B1-L11 current of B1-L11 is less than 2A before and after initialization of read out chips. Ordinal current consumption of ladder is from 3 to 4A. 5
What we have done at commissioning Optimization of operation parameters for all readout chip. Making of mask file to mask noise pixels. Threshold scan with noise trigger. Setting of threshold level. Noise level is < 0.1% Noise level for most of readout chips is < 0.01% 6
Hit Map of Barrel 0 (Zero Field RUN402340-0000) low rate SOUTH NORTH WEST The efficiency of B0-L8-South is quite low. Bias voltage for sensor modules of B0-L8-S was applied and we could see leak current. Not bias issue. NORTH SOUTH EAST Need to check the response from test pulse by changing some setting values on Wed. 7
Hit Map of Barrel 1 (Zero Field RUN402340-0000) low rate We will check some operation parameters for ladders whose efficiency is low. WEST EAST Connector of bias cable were broken Fixed LV is OFF 8
BBCZ vs VTXZ (RUN402336-0000-0004 336k events) bbc_z (cm) vtx_y (cm) Reconstructed with VTX standalone bbcz vs vtxz vtx_x (cm) vtx_z (cm) vtx_x (cm) Mean = -0.2 9 vtx_z-bbc_z (cm) Event Sequence
Event Number Dependence of Mean Multiplicity (VTXS) Sampling Event Number ADC sum is dropping around 10k events. X vertex is correlated with the dropping mean multiplicity of VTXS. Strip group is now working on this readout issue. GTM file was updated. The issue is supposed to be fixed. 10
Cluster Number vs bbc q(RUN402389-0000-0004 645k events) number of cluster (B0) number of cluster (B1) VTXP-B0 VTXP-B1 bbcq bbcq number of cluster (B3) number of cluster (B2) VTXS-B2 VTXS-B3 11 bbcq bbcq
Summary 15 GeV AuAu run started. VTXP is working. Operation parameters were optimized. There are no additional dead area except for one ladder (B1-L11) We have a read out issue for VTXS. The issue is supposed to be fixed today. 12
Hit Rate chip by chip (RUN14 Zero Field RUN402340) Hit rate is decreased to half for B0-WEST. B0-WEST B0-EAST B1-WEST B1-EAST Hit Rate (hit / chip / total event) average hit rate hit rate = 0 is removed for a average calculation 1.3 0.9 0.4 0.3 14 Chip Number
(Noise counts/chip) / (Total Number of Events (100k)) Noise-pixel-rate/chip is less than 0.1% B1-L5 chip8 and 9 B0-West B0-East B1-West B1-East 15 1 count / chip / 100k events
Leave B1-L5-chip8 and 9 Hit/Total events chip0 chip1 chip2 chip3 Threshold DACs chip4 chip5 chip6 chip7 Threshold level 1/3 x MIP (electrons) B1-L5 chip8 and 9 There exist unstable pixels. chip8 chip9 chip10 chip11 chip12 chip13 chip14 chip15 Probably unstable pixels cannot be removed with threshold Keep threshold level as 170 16
Cluster Number vs bbc q(RUN402389-0000-0004 645k events) Number of Clusters (EAST B0) Number of Clusters (EAST B0) VTXP-B0 VTXP-B1 Number of Clusters (WEST B0) Number of Clusters (WEST B0) Number of Clusters (EAST B0) Number of Clusters (EAST B0) VTXS-B2 VTXS-B3 17 Number of Clusters (WEST B0) Number of Clusters (WEST B0)
