Hit rate distribution
The purpose of this project is to optimize the hit rate distribution for Au+Au 200GeV run by analyzing chip-by-chip and half ladder-by-half ladder hit rates. Issues such as hot channels and low efficiency due to dead pixel areas are addressed, ensuring stable hit rates for VTXP. Images provide insights into the alignment meeting progress and areas needing optimization.
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Presentation Transcript
Hit rate distribution Taebong Moon Yonsei Univ./RIKEN Mar. 13th. 2014 Rad Lab
Purpose During Au+Au 200GeV run, threshold of hot and cold should be optimized. Method for optimization is to look into 1) Chip by Chip hit rate as Run ID 2) Half ladder by Half ladder hit rate as Run ID Before that, I have looked into those distribution using LE run. VTX alignment meeting
Chip by Chip Hot channel. Disappeared after FEED VTX alignment meeting
Chip by Chip Low eff. due to dead area of pixel VTX alignment meeting
Chip by Chip VTX alignment meeting
Chip by Chip B1-L3-South-West : always hot VTX alignment meeting
Half ladder by Half ladder Hit Rate for Each Half Ladder VTX alignment meeting
Half ladder by Half ladder Hit Rate for Each Half Ladder VTX alignment meeting
Half ladder by Half ladder Hit Rate for Each Half Ladder VTX alignment meeting
Half ladder by Half ladder Hit Rate for Each Half Ladder VTX alignment meeting
Summary Hit rate for VTXP is stable. We re ready to optimize threshold for 200GeV run. VTX alignment meeting