Nanoelectronics: Tunneling Through Potential Barriers and Junctions
Explore the fascinating world of nanoelectronics with a focus on tunneling phenomena through potential barriers, material interfaces, and various junctions. Learn about transmission probability, field emission, Fowler-Nordheim tunneling, and more in this comprehensive lecture adaptation.
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EE 315/ECE 451 NANOELECTRONICS I Adapted from a lecture by Dr. Ryan Munden
OUTLINE 2 6.1 Tunneling Through a Potential Barrier 6.2 Potential Energy Profiles for Material Interfaces 6.3 Applications of Tunneling 6.4 Main Points 8/18/2015 J. N. DENENBERG- FAIRFIELD UNIV. - EE315
6.1 TUNNELING THROUGHA POTENTIAL BARRIER 3 8/18/2015 J. N. DENENBERG- FAIRFIELD UNIV. - EE315
TRANSMISSION PROBABILITY 4 8/18/2015 J. N. DENENBERG- FAIRFIELD UNIV. - EE315
METAL-VACUUM JUNCTION 5 8/18/2015 J. N. DENENBERG- FAIRFIELD UNIV. - EE315
METAL SEMICONDUCTOR 6 JUNCTION 8/18/2015 J. N. DENENBERG- FAIRFIELD UNIV. - EE315
METAL SEMICONDUCTOR 7 JUNCTION 8/18/2015 J. N. DENENBERG- FAIRFIELD UNIV. - EE315
METAL-INSULATOR-METAL 8 JUNCTION 8/18/2015 J. N. DENENBERG- FAIRFIELD UNIV. - EE315
METAL-INSULATOR-METAL APPLIED BIAS 9 8/18/2015 J. N. DENENBERG- FAIRFIELD UNIV. - EE315
6.3 FIELD EMISSION 10 8/18/2015 J. N. DENENBERG- FAIRFIELD UNIV. - EE315
FOWLER-NORDHEIM TUNNELING 11 Fowler-Nordheim Tunneling 8/18/2015 J. N. DENENBERG- FAIRFIELD UNIV. - EE315
CNT FIELD EMISSION 12 8/18/2015 J. N. DENENBERG- FAIRFIELD UNIV. - EE315
MOSFET STRUCTURE 13 8/18/2015 J. N. DENENBERG- FAIRFIELD UNIV. - EE315
MOSFET INVERSION 14 8/18/2015 J. N. DENENBERG- FAIRFIELD UNIV. - EE315
HOT ELECTRON EFFECT 15 8/18/2015 J. N. DENENBERG- FAIRFIELD UNIV. - EE315
FN TUNNELINGIN MOSFET 16 8/18/2015 J. N. DENENBERG- FAIRFIELD UNIV. - EE315
STM 17 8/18/2015 J. N. DENENBERG- FAIRFIELD UNIV. - EE315
STM 18 8/18/2015 J. N. DENENBERG- FAIRFIELD UNIV. - EE315
RTD 19 8/18/2015 J. N. DENENBERG- FAIRFIELD UNIV. - EE315
RTD 20 8/18/2015 J. N. DENENBERG- FAIRFIELD UNIV. - EE315
MAIN POINTS 21 8/18/2015 J. N. DENENBERG- FAIRFIELD UNIV. - EE315
6.5 PROBLEMS 22 8/18/2015 J. N. DENENBERG- FAIRFIELD UNIV. - EE315