Understanding Dielectric Model Uncertainty by Thomas Meissner

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Explore the research on dielectric model uncertainty by Thomas Meissner, focusing on SST variation and error bar analysis. Learn about SST and SSS measurements, bias removal, and calibration methods. Gain insights into error bars in emissivity and Debye parameters determination.

  • Dielectric Model
  • Uncertainty
  • Thomas Meissner
  • Error Analysis
  • Remote Sensing
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  1. Dielectric Model Uncertainty THOMAS MEISSNER

  2. Ellison Meissner Wentz 2012. SST from 0 C to 30 C in steps of 1 C. SSS from 30 psu to 38 psu in steps of 0.5 psu. TB surface = Emissivity SST (Kelvin). Earth Incidence Angle = 55 . Freq [GHz] Freq [GHz] 1.4 7.0 10.7 18.7 37.0 89.0 Bias v Bias v- -pol [K] 1.05 1.13 1.26 1.61 2.57 4.52 pol [K] Bias h Bias h- -pol [K] 0.54 0.63 0.72 0.98 1.78 4.20 pol [K] SDEV v SDEV v- -pol [K] 0.11 0.16 0.24 0.48 0.87 1.11 pol [K] SDEV h SDEV h- -pol [K] 0.07 0.09 0.15 0.32 0.70 1.42 pol [K] Remove biases (systematic differences). Part of ocean target calibration: <TB (satellite)> = <TB (ocean)> <TB (satellite)> = <TB (ocean)>. Focus on standard deviations.

  3. Error bar in emissivity = RMS difference between blue and red-dashed curves.

  4. Error bar in Re()/Im() = RMS difference between blue and red-dashed curves. Same method can be used to determine error bars in Debye parameters: S, 1, , 1, 2,

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